Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,
Lawrence E Murr (Editor)The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Kategorije:
Godina:
1991
Izdanje:
2
Izdavač:
CRC Press
Jezik:
english
ISBN 10:
0585378886
ISBN 13:
9781482293357
Fajl:
PDF, 108.50 MB
IPFS:
,
english, 1991